Conducted Transient testing aims to ensure that a given product can withstand short-duration electrical disturbances on power and signal lines. This testing evaluates the immunity of electronic and electrical equipment against fast voltage and current transients that may occur in real-world environments, helping prevent malfunctions, performance degradation, or permanent damage.
Transient events on AC/DC power lines and communication ports can cause resets, component damage, or system instability. Transient testing exposes these vulnerabilities early, reducing costly redesigns.
Transient testing puts stress on MOVs, TVS diodes, filters, SMPS controllers, and power stages to confirm that the protection and conditioning circuits behave correctly under high-energy and fast-edged disturbances.
Transient disturbances often trigger microcontroller brownouts, logic faults, timing errors, and communication dropouts. Transient testing verifies that your embedded systems remain stable and functional under IEC/EN 61000-4 transient conditions.
Conducted transient testing significantly increases MTBF and reduces warranty returns by validating robustness before your product reaches customers.
Conducted transient tests being done in an ISO/IEC 17025 accredited Lab, provide the proof of immunity performance required for CE Marking and international regulatory approvals.
Our ISO 17025 accredited Lab covers the following main conducted transient tests:
The objective is to test immunity to repetitive fast voltage transients typically caused by switching of inductive loads, relay contact bounce, or other high-speed switching events on power or signal lines. Our test setup is equipped with cutting-edge single-phase and three-phase coupling/decoupling networks (CDNs) with a current rating of 32 A and transient generators capable of generating EFT pulses characterized by peak values up to 7-kV and durations down to nanoseconds with high repetition rates.
This aims to evaluate the equipment’s ability to withstand high-energy transients, such as those caused by lightning strikes, switching of the power grid, or large inductive loads. Surges are applied in the form of 1.2/50 µs voltage waves and 10/700 µs current waves applicable on AC mains, DC supply lines, and signal interfaces.
At Stancer, we leverage our testing equipment to simulate transients generated by the switching of inductive loads in industrial installations which are usually characterized by oscillatory Transient Overvoltages (TOVs). Our full-suite transient generator applies standard compliant ring-wave oscillatory transients characterized by a rise-time of 0.5 micro-second and maximum frequency of 100kHz.
A unique capability of Stancer Testing-Lab relies on its capability for performing automotive transient tests in compliance with ISO 7637-2. This standard specifically deals with automotive applications and defines multiple pulses that replicate disturbances in vehicle electrical subassemblies (ESA). The key pulses include:
These pulses are applied to power and signal lines to verify that automotive electronics maintain functionality under realistic electrical disturbances.
Stancer Testing-Lab relies on its sophisticated testing system for performing comprehensive set of electrical tests designed to verify the robustness and reliability of automotive electronic equipment when exposed to real-world vehicle power supply conditions. These tests cover steady-state and transient supply voltage variations, including overvoltage and undervoltage, voltage drops and short interruptions, and reset behavior as well as dynamic operating conditions such as engine starting profiles, momentary voltage dips, and slow voltage changes. Testing against severe electrical disturbances including load dump, superimposed AC ripple, and repetitive transient pulses is offered by our Lab.
